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Photoreflectance of single buried Si1−xGex epilayers (0.12
Carline, R. T., Hosea, T. J. C., Hall, D. J.Volume:
78
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.359829
File:
PDF, 651 KB
english, 1995