SiO[sub 2]–TiO[sub 2] interfaces studied by ellipsometry...

Journal of Applied Physics 2002 Vol. 92; Iss. 4

SiO[sub 2]–TiO[sub 2] interfaces studied by ellipsometry and x-ray photoemission spectroscopy

Gallas, B., Brunet-Bruneau, A., Fisson, S., Vuye, G., Rivory, J.
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Volume:
92
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1494843
File:
PDF, 370 KB
english, 2002
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