Analytical electron microscopy and Raman spectroscopy...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 1993 / 05 Vol. 11; Iss. 3

Analytical electron microscopy and Raman spectroscopy studies of carbon nitride thin films

Chen, Ming Y., Li, D., Lin, X., Dravid, V. P., Chung, Yip‐Wah, Wong, Ming‐Show, Sproul, William D.
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Volume:
11
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.578765
Date:
May, 1993
File:
PDF, 614 KB
english, 1993
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