Band alignment issues related to HfO[sub 2]∕SiO[sub 2]∕p-Si...

Journal of Applied Physics 2004 Vol. 96; Iss. 12

Band alignment issues related to HfO[sub 2]∕SiO[sub 2]∕p-Si gate stacks

Sayan, S., Emge, T., Garfunkel, E., Zhao, Xinyuan, Wielunski, L., Bartynski, R. A., Vanderbilt, David, Suehle, J. S., Suzer, S., Banaszak-Holl, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
96
Year:
2004
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1803107
File:
PDF, 389 KB
english, 2004
Conversion to is in progress
Conversion to is failed