Influence of surface bow on reconstruction on 2-inch SiC (0001) wafer
Zhu, Ming-Xing, Chen, Yi, Shi, Biao, Liu, Xue-Chao, Chang, Shao-Hui, Yan, Cheng-Feng, Yang, Jian-Hua, Shi, Er-WeiVolume:
111
Year:
2012
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3679130
File:
PDF, 2.39 MB
english, 2012