[IEEE IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society - Vienna, Austria (2013.11.10-2013.11.13)] IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society - Impact of CCA threshold, contention window, and transmit rate on VANET simulations
Fuxjager, Paul, Ruhrup, Stefan, Smely, DieterYear:
2013
Language:
english
DOI:
10.1109/iecon.2013.6700273
File:
PDF, 323 KB
english, 2013