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Electron traps in amorphous In–Ga–Zn–O thin films studied by isothermal capacitance transient spectroscopy
Hayashi, Kazushi, Hino, Aya, Morita, Shinya, Yasuno, Satoshi, Okada, Hiroshi, Kugimiya, ToshihiroVolume:
100
Year:
2012
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3691923
File:
PDF, 781 KB
english, 2012