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[IEEE 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) - Lake Buena Vista, FL, USA (2011.05.31-2011.06.3)] 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) - Interrogation of accrued damage and remaining life in field-deployed electronics subjected to multiple thermal environments of thermal aging and thermal cycling
Lall, Pradeep, Harsha, Mahendra, Kumar, Krishan, Goebel, Kai, Jones, Jim, Suhling, JeffYear:
2011
Language:
english
DOI:
10.1109/ectc.2011.5898600
File:
PDF, 5.85 MB
english, 2011