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Localization of Gate Bias Induced Threshold Voltage Degradation in a-Si:H TFTs
Shringarpure, Rahul, Venugopal, Sameer, Clark, Lawrence T., Allee, David R., Bawolek, EdwardVolume:
29
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.911609
Date:
January, 2008
File:
PDF, 270 KB
english, 2008