[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - A roaming memory test bench for detecting particle induced SEUs
Galliere, Jean-Marc, Rech, Paolo, Girard, Patrick, Dilillo, LuigiYear:
2010
Language:
english
DOI:
10.1109/test.2010.5699302
File:
PDF, 287 KB
english, 2010