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[IEEE 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014 - Tampa, FL, USA (2014.6.1-2014.6.6)] 2014 IEEE MTT-S International Microwave Symposium (IMS2014) - Impact of multi-finger geometry on the extrinsic parasitic resistances of microwave MOSFETs
Zarate-Rincon, Fabian, Alvarez-Botero, German A., Murphy-Arteaga, Roberto S., Torres-Torres, Reydezel, Ortiz-Conde, AdelmoYear:
2014
Language:
english
DOI:
10.1109/mwsym.2014.6848532
File:
PDF, 1.03 MB
english, 2014