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In situ study of the effect of temperature on the electronic structure of Ni[sub x]Mn[sub 3−x]O[sub 4+δ] thin films using scanning tunneling spectroscopy
Basu, A., Brinkman, A. W., Klusek, Z., Datta, P. K., Kowalczyk, P.Volume:
92
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1505690
File:
PDF, 388 KB
english, 2002