Temperature scanning small angle x-ray scattering...

Temperature scanning small angle x-ray scattering measurements of structural relaxation in type-III vitreous silica

Brüning, R., Levelut, C., Le Parc, R., Faivre, A., Semple, L., Vallee, M., Simon, J.-P., Hazemann, J.-L.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
102
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2799940
File:
PDF, 434 KB
english, 2007
Conversion to is in progress
Conversion to is failed