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Temperature scanning small angle x-ray scattering measurements of structural relaxation in type-III vitreous silica
Brüning, R., Levelut, C., Le Parc, R., Faivre, A., Semple, L., Vallee, M., Simon, J.-P., Hazemann, J.-L.Volume:
102
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2799940
File:
PDF, 434 KB
english, 2007