Triple-biprism electron interferometry
Harada, Ken, Matsuda, Tsuyoshi, Tonomura, Akira, Akashi, Tetsuya, Togawa, YoshihikoVolume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2198987
File:
PDF, 1.68 MB
english, 2006