![](/img/cover-not-exists.png)
[IEEE 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008 - Atlanta, GA, USA (2008.06.15-2008.06.20)] 2008 IEEE MTT-S International Microwave Symposium Digest - Over-determined offset short calibration of a VNA
Hoffmann, Johannes Paul, Leuchtmann, Pascal, Vahldieck, RudigerYear:
2008
Language:
english
DOI:
10.1109/mwsym.2008.4633318
File:
PDF, 274 KB
english, 2008