High-throughput step-and-repeat UV-nanoimprint lithography
Eung-sug Lee, Jun-ho Jeong, Young-suk Sim, Ki-don Kim, Dae-geun Choi, Jun-hyuk ChoiVolume:
6
Year:
2006
Language:
english
Pages:
1
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2006.01.019
File:
PDF, 799 KB
english, 2006