The dependence of dielectric properties on the thickness of (Ba,Sr)TiO3 thin films
Jeongmin Oh, Taeho Moon, Tae-Gon Kim, Chunjoong Kim, Jae Hun Lee, Sang Young Lee, Byungwoo ParkVolume:
7
Year:
2007
Language:
english
Pages:
4
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2006.03.004
File:
PDF, 250 KB
english, 2007