Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy
Schneegans, Olivier, Chrétien, Pascal, Houzé, Frédéric, Meyer, RenéVolume:
90
Year:
2007
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2437052
File:
PDF, 588 KB
english, 2007