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[IEEE 2007 2nd IEEE Conference on Industrial Electronics and Applications - Harbin, China (2007.05.23-2007.05.25)] 2007 2nd IEEE Conference on Industrial Electronics and Applications - A Study on the Natural Frequency Analysis and Test for Note Handling Units

Kim, Joo Han, Sung, Ha Kyeong, Rhyu, Se Hyun
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Year:
2007
DOI:
10.1109/iciea.2007.4318775
File:
PDF, 2.38 MB
2007
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