[IEEE 2007 American Control Conference - New York, NY, USA...

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[IEEE 2007 American Control Conference - New York, NY, USA (2007.07.9-2007.07.13)] 2007 American Control Conference - Dynamic optimization of multiscale PDE/kMC process systems using nonlinear order reduction and tabulation techniques

Varshney, Amit, Armaou, Antonios
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Year:
2007
Language:
english
DOI:
10.1109/acc.2007.4282728
File:
PDF, 255 KB
english, 2007
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