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Transmission electron microscopy without aberrations: Applications to materials science
Angus Kirkland, Lan-Yun Chang, Sarah Haigh, Crispin HetheringtonVolume:
8
Year:
2008
Language:
english
Pages:
4
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2007.10.065
File:
PDF, 649 KB
english, 2008