Self-consistent electrothermal Monte Carlo simulation of single InAs nanowire channel metal-insulator field-effect transistors
Sadi, Toufik, Thobel, Jean-Luc, Dessenne, FrançoisVolume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3496658
File:
PDF, 494 KB
english, 2010