A comparison of ferroelectric aging in bulk and thin-film...

A comparison of ferroelectric aging in bulk and thin-film materials

Pugh, Robert D., Sabochick, Michael J., Luke, Theodore E.
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Volume:
72
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.351831
File:
PDF, 1.18 MB
english, 1992
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