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Isothermal capacitance transient spectroscopy of electron and hole emissions from interface states in metal-oxide-semiconductor transistors
Yoshida, Haruhiko, Niu, Hirohiko, Kishino, Seigo^Volume:
73
Year:
1993
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.352784
File:
PDF, 768 KB
english, 1993