Characterization of Young’s modulus of silicon versus temperature using a “beam deflection” method with a four-point bending fixture
Chun-Hyung ChoVolume:
9
Year:
2009
Language:
english
Pages:
8
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2008.03.024
File:
PDF, 1.67 MB
english, 2009