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[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Parallel statistical analysis of analog circuits by GPU-accelerated graph-based approach
Xue-Xin Liu,, Tan, S. X-D, Hai Wang,Year:
2012
Language:
english
DOI:
10.1109/date.2012.6176615
File:
PDF, 1.05 MB
english, 2012