A spectroscopic ellipsometry study of TiO2 thin films...

Current Applied Physics 2009 Vol. 9; Iss. 3

A spectroscopic ellipsometry study of TiO2 thin films prepared by ion-assisted electron-beam evaporation

Pitak Eiamchai, Pongpan Chindaudom, Artorn Pokaipisit, Pichet Limsuwan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.cap.2008.06.011
File:
PDF, 286 KB
english, 2009
Conversion to is in progress
Conversion to is failed