Polymer diffusion as a probe of damage in ion or plasma etching
Tead, S. F., Vanderlinde, W. E., Marra, G., Ruoff, A. L., Kramer, E. J., Egitto, F. D.Volume:
68
Year:
1990
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.346433
File:
PDF, 1.58 MB
english, 1990