The effects of the post-annealing temperatures of TiO2...

Current Applied Physics 2009 Vol. 9; Iss. 3-supp-S

The effects of the post-annealing temperatures of TiO2 buffer layers on ferroelectric properties in PLZT thin films

Ji-Eon Yoon, Young-Guk Son
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Volume:
9
Year:
2009
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2009.01.026
File:
PDF, 1.79 MB
english, 2009
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