Low-damage low-k etching with an environmentally friendly CF[sub 3]I plasma
Soda, Eiichi, Kondo, Seiichi, Saito, Shuichi, Ichihashi, Yoshinari, Sato, Aiko, Ohtake, Hiroto, Samukawa, SeijiVolume:
26
Year:
2008
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.2919137
File:
PDF, 1.07 MB
english, 2008