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Statistical study of subthreshold characteristics in polycrystalline silicon thin-film transistors
Kitahara, Yoshiyuki, Takagi, Shigeyuki, Sano, NobuyukiVolume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1629154
File:
PDF, 695 KB
english, 2003