Electrical properties of HfO2 charge trap flash memory with...

Electrical properties of HfO2 charge trap flash memory with SiO2/HfO2/Al2O3 engineered tunnel layer

Se-Man Oh, Hee-wook You, Kwan-Su Kim, Young-Hie Lee, Won-Ju Cho
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
10
Year:
2010
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2009.12.005
File:
PDF, 328 KB
english, 2010
Conversion to is in progress
Conversion to is failed