[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Analysis of plasmon excited by metal-insulator-metal structure with insulator thickness of hundreds of nanometers
Tamura, Masaya, Kagata, HiroshiYear:
2010
Language:
english
DOI:
10.1109/mwsym.2010.5517115
File:
PDF, 60 KB
english, 2010