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[IEEE 2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - San Jose, CA, USA (2011.10.23-2011.10.26)] 2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems - An analytical resistive loss model for multiconductor transmission lines and the proof of its passivity
Broyde, Frederic, Clavelier, EvelyneYear:
2011
Language:
english
DOI:
10.1109/epeps.2011.6100203
File:
PDF, 300 KB
english, 2011