[IEEE 2013 IEEE International Symposium on Electromagnetic...

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[IEEE 2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013 - Denver, CO, USA (2013.08.5-2013.08.9)] 2013 IEEE International Symposium on Electromagnetic Compatibility - Critical equipment input impedance measurement for IEMI calculations

Mora, N., Salvatierra, M. J., Romero, C., Rachidi, F., Rubinstein, M.
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Year:
2013
Language:
english
DOI:
10.1109/isemc.2013.6670449
File:
PDF, 928 KB
english, 2013
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