Effect of metallic precursors on the thin film thickness and reaction resistances in the selenization process
Wei Liu, Jian-Guo Tian, Qing He, Feng-Yan Li, Chang-Jian Li, Yun SunVolume:
11
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.cap.2010.07.028
File:
PDF, 861 KB
english, 2011