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[IEEE 2010 IEEE 10th International Conference on Computer and Information Technology (CIT) - Bradford, United Kingdom (2010.06.29-2010.07.1)] 2010 10th IEEE International Conference on Computer and Information Technology - A Tree Based Strategy for Test Data Generation and Cost Calculation for Uniform and Non-Uniform Parametric Values
Klaib, Mohammad F.J., Muthuraman, Sangeetha, Ahmad, Noraziah, Sidek, RoslinaYear:
2010
Language:
english
DOI:
10.1109/cit.2010.246
File:
PDF, 437 KB
english, 2010