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[IEEE 2010 American Control Conference (ACC 2010) - Baltimore, MD (2010.6.30-2010.7.2)] Proceedings of the 2010 American Control Conference - Simulation of atomic force microscopy of molecular structures and interplay with experiment
Belikov, S, Magonov, SYear:
2010
Language:
english
DOI:
10.1109/acc.2010.5531150
File:
PDF, 1.47 MB
english, 2010