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Investigation of thickness dependence of the ferroelectric properties of Pb(Zr[sub 0.6]Ti[sub 0.4])O[sub 3] thin-film capacitors
Bouregba, R., Le Rhun, G., Poullain, G., Leclerc, G.Volume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2170414
File:
PDF, 385 KB
english, 2006