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Contact resistance dependent scaling-down behavior of amorphous InGaZnO thin-film transistors
Edward Namkyu Cho, Jung Han Kang, Ilgu YunVolume:
11
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.cap.2011.01.017
File:
PDF, 835 KB
english, 2011