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[IEEE 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO) - Portland, OR, USA (2011.08.15-2011.08.18)] 2011 11th IEEE International Conference on Nanotechnology - Analysis of yield improvement techniques for CNFET-based logic gates

Ashraf, Rehman, Chrzanowska-Jeske, Malgorzata, Narendra, Siva G.
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Year:
2011
Language:
english
DOI:
10.1109/nano.2011.6144653
File:
PDF, 474 KB
english, 2011
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