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Effect of Al addition on the microstructure and electronic structure of HfO[sub 2] film
Wang, X. F., Li, Quan, Egerton, R. F., Lee, P. F., Dai, J. Y., Hou, Z. F., Gong, X. G.Volume:
101
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2405741
File:
PDF, 421 KB
english, 2007