[IEEE 2014 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Grenoble, France (2014.6.30-2014.7.3)] 2014 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Reliability analysis of logic circuits using probabilistic techniques
Grandhi, Satish, Spagnol, Christian, Popovici, EmanuelYear:
2014
Language:
english
DOI:
10.1109/prime.2014.6872739
File:
PDF, 124 KB
english, 2014