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[IEEE 2011 50th IEEE Conference on Decision and Control and European Control Conference (CDC-ECC 2011) - Orlando, FL, USA (2011.12.12-2011.12.15)] IEEE Conference on Decision and Control and European Control Conference - Design and implementation of an atomic force microscope with adaptive sliding mode controller for large image scanning
Peng, Yuan-Zhi, Wu, Jun-Wei, Huang, Kuan-Chia, Chen, Jyun-Jhih, Chen, Mei-Yung, Fu, Li-ChenYear:
2011
Language:
english
DOI:
10.1109/cdc.2011.6161500
File:
PDF, 600 KB
english, 2011