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[IEEE 2008 International Solid-State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2008.02.3-2008.02.7)] 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - An All-Digital On-Chip Process-Control Monitor for Process-Variability Measurements
Klass, Fabian, Jain, Ashish, Hess, Greg, Park, BrianYear:
2008
Language:
english
DOI:
10.1109/isscc.2008.4523230
File:
PDF, 424 KB
english, 2008