[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - Remedies to control electromigration: Effects of CNT doped Sn-Ag-Cu interconnects
Xu, Sha, Zhu, Xiaoxin, Kotadia, Hiren, Lu, Hua, Mannan, Samjid H., Bailey, Chris, Chan, Y CYear:
2012
Language:
english
DOI:
10.1109/ectc.2012.6249097
File:
PDF, 538 KB
english, 2012