[IEEE Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat No 03CH37440) BIPOL-03 - Portland, OR (2002.09.30-2002.09.30)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat No 03CH37440) BIPOL-03 - Improving BiCMOS technologies using BJT parametric mismatch characterisation

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