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[IEEE 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Study of the programming sequence induced back-pattern effect in split-page 3D vertical-gate (VG) NAND flash
Wei-Chen Chen,, Lue, Hang-Ting, Kuo-Pin Chang,, Yi-Hsuan Hsiao,, Hsieh, Chih-Chang, Yen-Hao Shih,, Chih-Yuan Lu,Year:
2014
Language:
english
DOI:
10.1109/vlsi-tsa.2014.6839661
File:
PDF, 611 KB
english, 2014