[IEEE 2002 International Test Conference - Baltimore, MD,...

  • Main
  • [IEEE 2002 International Test...

[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - DFT techniques for wafer-level at-speed testing of high-speed SRAMs

Hirabayashi, O., Suzuki, A., Yabe, T., Kawasumi, A., Takeyama, Y., Kushida, K., Tohata, A., Otsuka, N.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2002
Language:
english
DOI:
10.1109/test.2002.1041757
File:
PDF, 366 KB
english, 2002
Conversion to is in progress
Conversion to is failed