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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - DFT techniques for wafer-level at-speed testing of high-speed SRAMs
Hirabayashi, O., Suzuki, A., Yabe, T., Kawasumi, A., Takeyama, Y., Kushida, K., Tohata, A., Otsuka, N.Year:
2002
Language:
english
DOI:
10.1109/test.2002.1041757
File:
PDF, 366 KB
english, 2002