[IEEE Industrial Engineering (CIE-40) - Awaji City, Japan (2010.07.25-2010.07.28)] The 40th International Conference on Computers & Indutrial Engineering - Wafer die yield prediction by heuristic methods
Chen, Kuentai, Chang, Ping-Yu, Yeh, Chien-HsingYear:
2010
Language:
english
DOI:
10.1109/iccie.2010.5668273
File:
PDF, 225 KB
english, 2010